Produkty dla osiowanie laserowe (1)

Ultimate imaging quality with buildin acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanningbytip system allow routine high resolution imaging. Equipped with 50+ AFM modes including HybriD mode all cuttingedge nanomechanical, electrical and magnetic studies are available in basic configuration. Automated study of samples arrays by userdefined scenario with database image storage. Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 μm positioning accuracy. Smart ScanT™ software for oneclick optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts. Wide possibilities of customization integration of addition optical equipment Type:tube scanner with closed loop sensors. Scanning by tip Scanning range, XYZ:100×100×10 µm or 2×2×1 µm in Low Voltage Mode Tip-Sample Positioning Type:motorized sample positioning in XYZ XYZ thermal drift:Less than 0.2 nm/min Moving range:200×200 mm in XY, 30 mm in Z Positioning accuracy:1 µm in XY, 0.2 µm in Z Positioning speed:8 mm/sec in XY Approach:smart soft approach algorithm Optical beam deflection sensor noise:<25 fm/√Hz above 50 kHz Resolution:0,98 μm Field of view:up to 1.2×0.8 mm (5 Mpixel) Autofocus:on cantilever, on sample AFM probes:probe holder supports most commercially available probes Number of scan channels:up to 24 Signal processing:512 Mb buffer Size, 3x 340 MHz FPGA, 320 MHz DSP Lock-in amplifiers:2x analog lock-in amplifiers, 3x digital lock-in amplifiers (Multifrequency AFM modes supporting) Generators:6x 32 bit digital generators, 4x for Lock-in Self-testing:automated performance check Scanning parameters auto adjustment:drive amplitude, lock-in gain, setpoint, feedback gain, scanning rate Programming tools:Nova PowerScript language, LabView integration, Database integration PC interface:USB Temperature stabilization:build-in fan free thermal stabilization with 0.05 °C accuracy Acoustic isolation:build-in acoustic enclosure Vibration isolation:build-in active vibration isolation table Nanolithography:Voltage, Current, Force (All Vector and Raster) Spectroscopy:Force-, Amplitude-, Phase-, Frequency-, Current-Distance, I(V), Piezopulse, Custom mode Dimensions:W×L×H; 810×610×1450 mm